Microscopy and Microanalysis of Nano-Scale Materials
نویسندگان
چکیده
منابع مشابه
An overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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Conservation involves the conservation and preservation of museum objects and historical monuments utilizing compositional and structural information obtained from modern analytical techniques. The conservation of oil paintings requires an understanding of the individual structure of each work of art. This often involves the need for 1) correct identification of the pigments used by the artist,...
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ویژگی های زمین شیمیایی، کانی شناسی، و میکرومورفولوژیکی خاک ها و سنگ مادر مربوطه در منطقه بین بخش های جنوبی زاگرس و خلیج فارس تا دریای عمان(استان هرمزگان، ایران) مورد بررسی قرار گرفت. هدف های این مطالعه شناسایی تغییرات در خصوصیات فیزیکی، شیمیایی، و ترکیب کانی شناسی خاک، مطالعه میکرومورفولوژی و تکامل خاک، و بررسی توزیع عنصر خاک بر اساس هوازدگی، پروسه های خاک و زمین شناسی جهت توصیف اثرات مواد مادر...
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ژورنال
عنوان ژورنال: Microscopy Today
سال: 2006
ISSN: 1551-9295,2150-3583
DOI: 10.1017/s1551929500058594